ABSTRACT
As the preferred architecture for high-speed and high-resolution analog-to-digital converters (ADC), the accuracy of pipelined ADC is limited mainly by various errors arising from multiple digital-to-analog converters (MDAC). This paper presents a multi-dimensional (M-D) MDAC calibration based on a genetic algorithm (GA) in a 12-bit 750 MS/s pipelined ADC. The proposed M-D MDAC compensation model enables capacitor mismatch and static interstage gain error (IGE) compensation on the chip and prepares for subsequent background calibration based on a pseudo-random number (PN) injection to achieve accurate compensation for dynamic IGE. An M-D coefficient extraction scheme based on GA is also proposed to extract the required compensation coefficients of the foreground calibration, which avoids falling into local traps through MATLAB. The above calibration scheme has been verified in a prototype 12-bit 750 MS/s pipelined ADC. The measurement results show that the signal-to-noise and distortion ratio (SNDR) and spurious-free dynamic range (SFDR) are increased from 49.9 dB/66.7 dB to 59.6 dB/77.5 dB with the proposed calibration at 25 °C. With the help of background calibration at 85 °C, the SNDR and SFDR are improved by 3.4 dB and 8.8 dB, respectively.
